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What the posting requires

Required
  • Optical imaging
  • EUV lithography
  • Scanner performance optimization
  • Lithography
  • Metrology
  • Process control
  • Physics
  • Optical Engineering
  • Electrical Engineering
Preferred
  • Scanner performance
  • EUV mask characterization
  • 3D feature metrology
  • Computational imaging
  • Inspection
  • Resist behavior

These tags are our reading of the posting. They can miss something; the original posting is the reference.

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